SOC410 reflectance measurements
Reflectance measurements in 6 spectral bands spreading from the shortwave to the thermal infrared acquired using a SOC410-DHR handheld reflectometer. The objective was to collect a large set of material samples representative of the urban lansdscape. Some measurements were performed simultaneously over the same samples with a spectroradiometer (ASD) or a CIMEL thermal radiometer. The SOC410 measures the reflectance for two view angles (20 and 60°) and in 6 spectral bands: - 0.9-1.1 microns - 1.9-2.4 microns - 3.0-3.9 microns - 3.0-5.0 microns - 4.0-5.0 microns - 8.0-12.0 microns More detailled caracteristics can be found here: https://surfaceoptics.com/wp-content/uploads/2020/11/410-DHR-Datasheet.pdf Pictures are available for some of the samples. Check the README file to get more information on the data organisation and characteristics.
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- Link to Original Record [https://sedoo.fr/theia-publication-products] This metadata comes from sedoo.fr
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